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AC Resonant Test System
Yangzhou Power Electric Co., Ltd
Testing of certain apparatus requires much high voltage or current that a straight AC test system is not sufficient. Thus resonant test reactor with a variable core is needed. The main advantage of such test systems is lower input power and larger output power. The resonant test system is designed to compensate capacitance in the testing circuit precisely by tuning inductance of the test system. AC resonant test system is used for factory testing of middle, high and ultra-high voltage cables, capacitors, generators, motors, power transformers and gas-insulated switchgears.
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Non-Destructive Test Resonant Inspection Station
RAM-TEST-FIXTURE
The NDT Test Station, Model RAM-TEST-FIXTURE Resonant Inspection System is an ideal choice for testing when repeatable manual inspections are required. The innovative Test Station allows precise control of part positioning with an adjustable table ranging up to 6.25 inches (158.75 mm) in height.
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AC Resonant Test System for Cable
HTXZ / 130
Wuhan Huatian Electric Power Automation Co., Ltd.
Portable frequency conversion resonance voltage test device for domestic cables.
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AC Resonant Test System for CVT
XZB-H / 110
Wuhan Huatian Electric Power Automation Co., Ltd.
Adjustable resonance device for field calibration of capacitive voltage transformers up to 500kV.
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Non-Destructive Test Resonant Inspection System
RAM-AUTO
Resonant Acoustic Method is designed to help deliver fully inspected parts, economically and on time. Every component has a unique resonant signature or pattern that reflects its composition.
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Non-Destructive Resonant Inspection Drop Test Fixture
RAM-DROP
The Drop Test Fixture, Model RAM-DROP, Resonant Inspection System, allows automated sorting and quality testing of small metal injection molded (MIM), powder injection molded (PIM), additively manufactured, and other small parts by using the Resonant Acoustic Method (NDT-RAM).
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Complete Set of Cascaded Resonant Test Equipment
Shanghai Launch Electric Co., Ltd.
FM cascaded resonant test set is used fo ron site AC voltage withstand tests on large capacitance power equipment like SF6 breakers, GIS combination electric, power cables, etc with the voltage class up to 1000KV.
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Variable Frequency AC Resonant Test System
HDXZ-162kVA/54kV
HD Power Test Equipment Co.ltd
HDXZ-162kVA/54kV Variable Frequency AC Resonant Test System is applied for AC dielectric withstand test for electric equipment.The system is mainly composed of following parts:variable frequency control power supply,exciting transformer,reactor and capacitive divider.1. 10kV/300mm2 cable 3km AC withstand voltage test, capacitance ≤1.1265uF, test frequency 30-300Hz, test voltage 22kV, test time 5min.2. 35kV/300mm2 cable 1.5km AC withstand voltage test, capacitance ≤0.2917uF, test frequency 30-300Hz, test voltage 52kV, test time 60min.
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Variable Frequency AC Resonant Test System
HDXZ-270kVA/270kV
HD Power Test Equipment Co.ltd
HDXZ-270kVA/270kV Variable Frequency AC Resonant Test System is applied for AC dielectric test for electric equipment.1. 10kV/300mm2 cable 3km AC withstand test,capacitance≤1.1265uF,test frequency:30-300Hz, test voltage 22kV, test time 5min;2. 35kV/300mm2 cable 1km AC withstand test,capacitance≤0.1945uF,test frequency:30-300Hz, test voltage 52kV, test time 60min;3. 110kV/630mm2 cable 0.2km AC withstand test,capacitance≤0.0368uF,test frequency:30-300Hz, test voltage 128kV, test time 60min;4. 110kV/63000kVA Transformer AC withstand test,capacitance≤0.02uF,test frequency:30-300Hz, test voltage below 160kV, test time 1min;5. GIS 110kV, Switching busbar and other substation equipment, AC withstand test,test frequency:30-300Hz, test voltage below 265kV, test time 5min
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Power Frequency Series Resonant Test System
HTZX(L) / 140
Wuhan Huatian Electric Power Automation Co., Ltd.
AC withstand test for single hydrodynamo with capacity of 250MW or less.
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Variable Frequency Series Resonant Test System
HTXZ(L) / 150
Wuhan Huatian Electric Power Automation Co., Ltd.
This system is designed and manufactured for the communication withstand voltage test of 11kV/30MW hydro-generator.
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Complete Set of Xlpe Cable Resonant Test Equipment
Shanghai Launch Electric Co., Ltd.
Applied for power frequency voltage withstand and partial discharge testing on cables and cable accessories with the voltage class up to 1100kv.
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EFT Module for Teststand
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Test Solutions
Our range of test solutions is far reaching, comprised of off-the-shelf test instruments and interfaces, standard automated test systems, and custom solutions for test, simulation, and training. Put our E2E focus and experience to work for you with these solutions: automated test equipment, maintenance trainers, and test management software.
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Tactical Radio Test Set
CTS-6010
The CTS-6010 brings an entire test bench to your front lines. Enable your technicians to detect equipment faults and verify operational capabilities at the I- and O-levels, saving valuable diagnostic time and cost.
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PCI Express 5.0 Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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PCIe 5.0 Test Platform
PXP-500A
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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ARINC 818 Tester
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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Automatic Test System
Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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SoC Test System
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Semiconductor Test System
TS-960e
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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VLSI Test System
3380P
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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VLSI Test System
3380D
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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OLED Lifetime Test System
58131
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Regenerative Battery Pack Test System
17020E
Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
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Photodiode Burn-in Reliability Test System
58606
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Regenerative Battery Pack Test System
17040E
High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
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Photonics Module Test System
58625
Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
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PXI Semiconductor/IC Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
